Showing results: 16 - 30 of 334 items found.
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MSOV134A -
Keysight Technologies
13 GHz analog bandwidth (upgradable)4 analog plus 16 digital channels Capture a longer signal trace with up to 80 GSa/s sample rate and 2 Gpts of acquisition memory Get the best signal integrity with the low noise floor (1.09 mVrms at 50 mV/div) and lowest jitter measurement floor (100 fs)See better measurement accuracy with ENOB values in excess of 5.5 and a SFDR exceeding 50 dBC Access the broadest range of jitter, trigger, analysis and protocol tools (featuring Precision Probe)
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MTS1020i -
Applied Test Resources
The MTS-1020i is a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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MTS2010i -
Applied Test Resources
The MTS-2010i are a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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MSAT -
ARC Technology Solutions
Whether you are testing radar systems for the Department of Defense (DoD), or the next actuator circuit card for aircraft landing systems, ARC’s Mixed Signal Automated Tester (MSAT) offers flexible automated testing capabilities for nearly every budget.
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Analog Devices Inc.
Analog Devices optical mixed signal devices comprise a portfolio of highly integrated analog front ends and integrated optical modules. The discrete analog front ends offer flexibility in optimizing a given solution. The integrated optical modules are highly optimized for applications such as vital signs monitoring in smart watches and other wearables and offer very small form factors and reduce the required systems engineering to get to market.
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MTS1010i -
Applied Test Resources
The MTS-1010i is a more economical version of the MTS-2010i & MTS-1020i testers. It has a reduced platform size and reduced power supplies. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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MTS1000i -
Applied Test Resources
The MTS-1000i is lowest cost platform available in the MTS series of ATE. It has a reduced platform size compared to the MTS-2010i & MTS-1020i, reduced power supplies, and 4 slots. It is mainly intended for single site testing. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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SPEA S.p.A.
- PC-performance independent: multiple SPEA CPUs provide test program timing, while pc replacement does not require the test program requalification- Pattern-based programming: -30% test time vs competitors- 64-line synchrobus and 16-line high-speed synchrobus for real-time instrument synchronization: no embedded delay when running pattern-based testing- 99% parallel test efficiency- Multi-site test capabilities for up to 256 devices in parallel- High-density, floating instruments, for true parallel analog test- Universal slot architecture, up to 1,408 channels- RF generators up to 3 GHz
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MSO/DPO70000 Series -
Tektronix, Inc.
The MSO/DPO70000 is one of the most advanced oscilloscopes in its class: enabling today’s engineer to see signals better with minimal noise, debug signal anomalies faster, reduce debug time, and utilize measurement and analysis tools for automated compliance testing and other verifications. In addition, the MSO/DPO70000 is perfect for analog/digital design and debug, data communications and high-speed serial communications. See how you can use the MSO/DPO70000 for your next project to find and analyze a wide range of mixed-signal anomalies.
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JT 5705 -
JTAG Technologies Inc.
The JT 5705 series offer a unique combination of JTAG TAP controller (tester) interfaces plus digital and analog I/O in compact desktop package.Use the ‘mixed-signal’ features to measure power supplies, clock frequencies or test DACs and ADCs. Add your own capability through use of CoreCommander FPGA our generic bridge/translator system.
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2 Series MSO -
Tektronix, Inc.
Unlock more space on your bench without compromising performance by choosing our most compact and portable oscilloscope. At only 1.5 inches thick and less than 4 pounds, the 2 Series MSO feels like a tablet while offering the full-featured functionality of a realtime touchscreen oscilloscope. On the benchtop, in the classroom, or to the field, take it wherever your measurement challenges take you.
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ShibaSoku Co., Ltd.
Multi-pin type model is now launched in WL27 Logic/Power mixed LSI test system.This system is suitable for multi-site test in A/D mixed device such as automotive・motor driver IC. It’s a high throughput and cost performance mixed signal LSI test system.
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BS120 -
BitScope
BS120 combines a powerful Mixed Signal Scope with an integrated DSP waveform generator and logic analyzer.
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PicoScope® 2000 Series -
Pico Technology Ltd.
You can use your PicoScope 2000 Series as an advanced oscilloscope, spectrum analyzer, function generator, arbitrary waveform generator and protocol decoder out of the box. Mixed signal models also add a 16 channel logic analyzer. A complete electronics lab in one compact, low-cost, USB-powered unit.